Fluke Corporation MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 8025B: (1 year) CAL VER /5500 DATE: 03-Feb-95 AUTHOR: Fluke Corporation REVISION: $Revision: 1.2 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 29 NUMBER OF LINES: 143 CONFIGURATION: Fluke 5500A ============================================================================= # # Source: # T.O. 33A1-12-1300-1 # Fluke 8025B instruction manual (PN 824482 Feb. 1988, Errata No. 3, 1/91). # # Compatibility: # 5500/CAL 4.0 or MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # 55_27_2W.bmp # 55_27_CW.bmp # 55_27_LA.bmp # 55_27_HA.bmp # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5500A accuracy file contains 90 day specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 90 day specifications of the 5500A are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R J F W 1.002 ASK+ K 1.003 HEAD EQUIPMENT SETUP 1.004 DISP [32] WARNING 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 HEAD {DISPLAY TEST} 1.006 DISP Turn the UUT on. 1.006 DISP AS the UUT is turned ON, verify that all display 1.006 DISP segments momentarily light up. 1.007 EVAL Did the UUT display test pass? 2.001 DISP Allow the UUT to stabilize at: 2.001 DISP Ambient temperature: 18C - 28C. 2.001 DISP Relative humidity: less than 80%. 2.002 HEAD {RESISTANCE TESTS} 2.003 DISP Select the Ohms Function. 2.004 PIC 55_27_CW 2.005 HEAD RESISTANCE TESTS: {320 Ohm Range} 2.006 5500 320 100.0Z 0.5U CW 3.001 HEAD RESISTANCE TESTS: {3.2 kOhm Range} 3.002 5500 3.2 1.000kZ 0.003U CW 4.001 HEAD RESISTANCE TESTS: {32 kOhm Range} 4.002 5500 32 10.00kZ 0.03U CW 5.001 HEAD RESISTANCE TESTS: {320 kOhm Range} 5.002 PIC 55_27_2W 5.003 5500 320 100.0kZ 0.3U 2W 6.001 HEAD RESISTANCE TESTS: {3.2 MOhm Range} 6.002 5500 3.2 1.000MZ 0.003U 2W 7.001 HEAD RESISTANCE TESTS: {32 MOhm Range} 7.002 5500 32 10.00MZ 0.11U 2W 8.001 ASK- U 8.002 HEAD {CONDUCTANCE TEST} 8.003 DISP Press RANGE twice to select nanosiemens. 8.004 HEAD CONDUCTANCE TEST: {32nS Range} 8.005 MATH MEM1 = 0 8.006 MEMI Use keyboard to enter actual UUT reading in nS: 8.007 MEME 8.008 MEMC 32 nY 0.10U 9.001 ASK+ U 9.002 HEAD {AC VOLTAGE TESTS} 9.003 DISP Select the ACV Function. 9.004 HEAD AC VOLTAGE TESTS: {3.2V Range} 9.005 5500 3.2 2.700V 0.016U 100H SI 2W 10.001 HEAD AC VOLTAGE TESTS: {32V Range} 10.002 5500 32 27.00V 0.57U 10kH SI 2W 11.001 HEAD AC VOLTAGE TESTS: {320V Range} 11.002 5500 320 250.0V 5.3U 10kH SI 2W 12.001 HEAD AC VOLTAGE TESTS: {1000V Range} 12.002 5500 1000 1000V 33U 10kH SI 2W 13.001 HEAD {DC VOLTAGE TESTS} 13.002 DISP Select the DCV Function. 13.003 HEAD DC VOLTAGE TESTS: {3.2V Range} 13.004 5500 3.2 2.700V 0.003U 2W 14.001 HEAD DC VOLTAGE TESTS: {32V Range} 14.002 5500 32 27.00V 0.03U 2W 15.001 HEAD DC VOLTAGE TESTS: {320V Range} 15.002 5500 320 250.0V 0.3U 2W 16.001 HEAD DC VOLTAGE TESTS: {1000V Range} 16.002 5500 1000 1000V 2U 2W 17.001 HEAD {DIODE TEST} 17.002 DISP Select the DIODE Function. 17.003 EVAL Is the UUT displaying the {overload indicator} (OL)? 18.001 M550 RNGLK 3.3V 18.002 5500 0.090V 0.002U 2W 19.001 5500 0.090V S 2W 19.002 EVAL Is the {beeper on}? 20.001 5500 0.110V S 2W 20.002 EVAL Is the {beeper off}? 21.001 ASK- N 21.002 MESS Slowly decrease the stimulus to 0.6V. 21.002 MESS Verify that the meter produces a short beep as the 21.002 MESS voltage descends through 0.7V (diode threshold). 21.003 5500 1.000V N 2W 21.004 MESS 21.005 EVAL Did the meter produce a short beep through 0.7V? 22.001 M550 * 22.002 HEAD {AC MILLIAMP TESTS} 22.003 DISP Select the AC mA/A Function. 22.004 PIC 55_27_LA 22.005 HEAD AC MILLIAMP TESTS: {32mA Range} 22.006 5500 32 27.00mA 0.42U 50H SI 2W 23.001 HEAD AC MILLIAMP TESTS: {320mA Range} 23.002 5500 320 270.0mA 4.2U 50H SI 2W 24.001 HEAD {AC MICROAMP TEST} 24.002 DISP Select the AC uA Function. 24.003 HEAD AC MICROAMP TEST: {3200uA Range} 24.004 5500 3200 2700uA 42U 500H SI 2W 25.001 HEAD {DC MICROAMP TEST} 25.002 DISP Select the DC uA Function. 25.003 HEAD DC MICROAMP TEST: {3200uA Range} 25.004 5500 3200 2700uA 22U 2W 26.001 HEAD {DC MILLIAMP TESTS} 26.002 DISP Select the DC mA/A Function. 26.003 HEAD DC MILLIAMP TESTS: {32mA Range} 26.004 5500 32 27.00mA 0.22U 2W 27.001 HEAD {DC AMP TEST} 27.002 PIC 55_27_HA 27.003 HEAD DC AMP TEST: {10A Range} 27.004 5500 10 5.00A 0.06U 2W 28.001 HEAD {AC AMP TEST} 28.002 DISP Select the AC mA/A Function. 28.003 HEAD AC AMP TEST: {10A Range} 28.004 5500 10 5.00A 0.09U 1kH SI 2W 29.001 HEAD 29.002 END